SIL8000 晶园自动进样器

    制造厂商:    意大利 Astel

    The most effective system to automatically load wafers on a microscope

    High speed, safe and smooth wafer handling

    Automatic wafer size detection

    Full set of inspection type come as standard: All wafers, programmed, random and statistical

    Cassette laser mapping, wafer protrusion, cross-slot detection and critical handling conditions come as standard safety features

    PC based controller, Windows 10

    Touch screen interface

    Designed for Leica DM8000, compatible with many semiconductor inspection microscopes like Nikon, Olympus, Zeiss

    Basic bright light inspection available as option